Test Date: 2014-02-17 10:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4159
mu μ 179.66
sigma σ 19.22
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4159
mu μ 40.05
sigma σ 1.93
over >= 1.00
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 54.63
RMS RMS 6.05
nSigma σ 5.0
Threshold threshold 84.89
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 453
nDeadPixel Dead Pixels 1
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 0
nDeadTrimbits Dead Trimbits 452
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 3
Address Decoding: C0
PHCalibrationGain
Plot
N N 3976
mu μ 5.10
sigma σ 0.12
over >= 183.00
Par1N Par1 N 4158
Par1mu Par1 μ 0.78
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
Plot
N N 4158
mu μ 30.47
sigma σ 4.77
under <= 1.00
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 77 DAC
CalDel CalDel 127 DAC
VthrComp VthrComp 67 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC