Test Date: 2014-02-17 09:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4125
mu μ 214.11
sigma σ 34.81
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 40.08
sigma σ 2.02
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 52.97
RMS RMS 6.65
nSigma σ 5.0
Threshold threshold 86.2
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 45
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 1
nDeadTrimbits Dead Trimbits 45
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 2
Address Decoding: C0
PHCalibrationGain
Plot
N N 3992
mu μ 5.08
sigma σ 0.17
over >= 167.00
Par1N Par1 N 4160
Par1mu Par1 μ 0.84
Par1sigma Par1 σ 0.05
PHCalibrationPedestal
Plot
N N 4159
mu μ 56.29
sigma σ 4.29
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 76 DAC
CalDel CalDel 150 DAC
VthrComp VthrComp 66 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC