Test Date: 2014-02-17 09:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4159
mu μ 172.00
sigma σ 22.89
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 39.96
sigma σ 1.87
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 40.81
RMS RMS 4.72
nSigma σ 5.0
Threshold threshold 64.39
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 635
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 0
nDeadTrimbits Dead Trimbits 635
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 3
Address Decoding: C0
PHCalibrationGain
Plot
N N 4038
mu μ 4.95
sigma σ 0.15
over >= 121.00
Par1N Par1 N 4160
Par1mu Par1 μ 0.74
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
Plot
N N 4159
mu μ 52.61
sigma σ 4.87
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 82 DAC
CalDel CalDel 127 DAC
VthrComp VthrComp 65 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC