Test Date: 2014-02-14 14:02
R0101 ModuleFulltest_m15_1
Chips

Overview

Vcal Threshold
Summary 1
Module Module R0101
Grade Grade A
PixelDefects Pixel Defects - A/B/C 1138 - 0/0/1
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-02-14
TestTime Test Time 14:02
TempC Temparature -15 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 90.62 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 48.00 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.02 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 119.00 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.42
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I_rec(150 V) @ 17°C 0.11 μA
CurrentAtVoltage150_ORIG I_orig(150V) @ -15.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.15
IVCurve
CurrentAtVoltage150 I_orig(150V) @ -15.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.15
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.11 μA
Noise
mu μ 90.62
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 119.00
Parameter1
mu μ 0.42
Temperature Analysis
MeanTemperature MeanTemperature 0 ± 0 degC
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 1138 0 0 0 1138 0 0 0 0 0 0
_