Test Date: 2014-06-05 10:06
R0212 ModuleFulltestPyXar_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0212
Grade Grade A
PixelDefects Pixel Defects - A/B/C 16 - 1/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 15
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-06-05
TestTime Test Time 10:06
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 186.78 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 121.55 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.05 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 397.15 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I(150 V) 0.06 μA
CurrentVariation I(150 V) / I(100 V) 1.18
IVCurve
CurrentAtVoltage150 I(150 V) 0.06 μA
Variation I(150 V) / I(100 V) 1.18
Noise
mu μ 186.78
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 397.15
Parameter1
mu μ 0.77
Temperature
Temperature Temp. while test 17.00 +/- 0.04 °C
Duration Duration of test 0:18:31
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 16 1 0 15 0 0 0 1 0 0 0
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