Test Date: 2014-06-05 10:06
R0212 ModuleFulltestPyXar_m20_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0212
Grade Grade A
PixelDefects Pixel Defects - A/B/C 17 - 1/0/0
DeadPixels Dead Pixels 2
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 15
NoisyPixels Noisy Pixels 42
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-06-05
TestTime Test Time 10:06
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 211.68 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 124.80 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 358.15 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 1.01
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I_rec(150 V) @ 17°C 0.22 μA
CurrentAtVoltage150_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.21
IVCurve
CurrentAtVoltage150 I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.21
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.22 μA
Noise
mu μ 211.68
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 358.15
Parameter1
mu μ 1.01
Temperature
Temperature Temp. while test -19.49 +/- 0.02 °C
Duration Duration of test 0:18:45
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 17 2 0 15 0 0 42 1 0 0 0
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