Test Date: 2014-05-15 13:05
R0206 ModuleFulltestPyXar_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0206
Grade Grade A
PixelDefects Pixel Defects - A/B/C 16 - 1/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 15
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-05-15
TestTime Test Time 13:05
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 209.79 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 139.75 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 384.15 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.83
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I(150 V) 0.11 μA
CurrentVariation I(150 V) / I(100 V) 1.13
IVCurve
CurrentAtVoltage150 I(150 V) 0.11 μA
Variation I(150 V) / I(100 V) 1.13
Noise
mu μ 209.79
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 384.15
Parameter1
mu μ 0.83
Temperature
Temperature Temp. while test 17.00 +/- 0.03 °C
Duration Duration of test 0:21:10
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 16 1 0 15 0 0 0 1 0 0 0
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