Test Date: 2014-05-15 12:05
R0205 ModuleFulltestPyXar_m20_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0205
Grade Grade A
PixelDefects Pixel Defects - A/B/C 5 - 1/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 1
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 4
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-05-15
TestTime Test Time 12:05
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 170.41 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 130.65 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 360.75 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.90
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I_rec(150 V) @ 17°C 0.14 μA
CurrentAtVoltage150_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.05
IVCurve
CurrentAtVoltage150 I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.05
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.14 μA
Noise
mu μ 170.41
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 360.75
Parameter1
mu μ 0.90
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 0:19:50
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 5 1 0 4 0 0 0 1 0 0 0
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