Test Date: 2014-05-14 17:05
R0202 ModuleFulltestPyXar_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module R0202
Grade Grade A
PixelDefects Pixel Defects - A/B/C 6 - 1/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noisy Pixels 13
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-05-14
TestTime Test Time 17:05
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 189.96 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 120.25 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 385.45 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.71
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I(150 V) 0.06 μA
CurrentVariation I(150 V) / I(100 V) 1.10
IVCurve
CurrentAtVoltage150 I(150 V) 0.06 μA
Variation I(150 V) / I(100 V) 1.10
Noise
mu μ 189.96
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 385.45
Parameter1
mu μ 0.71
Temperature
Temperature Temp. while test 17.00 +/- 0.03 °C
Duration Duration of test 0:17:14
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 6 1 0 2 3 0 13 0 0 0 0
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