Test Date: 2013-05-31 14:05
M0823 ModuleFulltest_p17_1
Chips

Overview

AddressLevelOverview

Overview

Vcal Threshold
Summary 1
Module Module M0823
Grade Grade B
BadRocs ROCs > 1% defects 0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 2
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2013-05-31
TestTime Test Time 14:05
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 150.63 e
VcalThrWidth Vcal Thr. Width 83.66 e
RelGainWidth Rel. Gain Width 0.03 %
PedestalSpread Pedestal Spread 3031.49 e
Parameter1 Parameter1 0.62
CurrentAtVoltage150 I(150 V) 0.16 μA
CurrentVariation I(150 V) / I(100 V) 1.23
IVCurve
Plot
CurrentAtVoltage150 I(150 V) 0.16 μA
Variation I(150 V) / I(100 V) 1.23
Noise
Plot
mu μ 150.63
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Plot
mu μ 3031.49
Parameter1
Plot
mu μ 0.62
Temperature Analysis
MeanTemperature MeanTemperature 0 ± 0 degC
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 0 0 0 0 0 0 0 0 0 0 0
Chip 1 0 0 0 0 0 0 0 0 0 0 0
Chip 2 0 0 0 0 0 0 0 0 0 0 0
Chip 3 0 0 0 0 0 0 0 0 0 0 0
Chip 4 0 0 0 0 0 0 0 0 0 0 0
Chip 5 0 0 0 0 0 0 0 0 0 0 0
Chip 6 0 0 0 0 0 0 0 0 0 0 0
Chip 7 0 0 0 0 0 0 0 0 0 0 0
Chip 8 0 0 0 0 0 0 0 0 0 0 0
Chip 9 0 0 0 0 0 0 0 0 0 0 0
Chip 10 0 0 0 0 0 0 0 0 0 0 0
Chip 11 0 0 0 0 0 0 0 0 0 0 0
Chip 12 0 0 0 0 0 0 0 0 0 0 0
Chip 13 0 0 0 0 0 0 0 0 0 0 0
Chip 14 0 0 0 0 0 0 0 0 0 0 0
Chip 15 1 1 0 2 0 0 0 0 0 0 0
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