Test Date: 2016-08-23 16:36
Analysis date: 2016-08-23 17:09
M3518 ModuleReceptionTest_p17_1
Chips

Overview

Pixel Alive Map
Summary
Module Module M3518
Grade Grade B
ManualGrade Manual grade -
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
DeadPixels Dead Pixels 327
DefectiveBumps Bump Defects 1
DefectiveBumpsMax Max BumpDef/ROC 1
DeadPixelsMax Max Dead Pixels/ROC 87
Readback Readback calibration ok
Bump Bonding Defects Map
IanaLoss
Plot
IanaLossProblems Iana problems No
Mean mean 20.05
Min min 19.30
Max max 20.90
NROCsNotProgrammable ROCs not programmable 0
Bump Bonding Thrmap
IVCurve
Plot
CurrentAtVoltage150V I(150 V) 0.81 μA
Variation I(150 V) / I(100 V) 1.10
IV150DB I(150 V) Fulltest 0.77 μA
ReadbackStatus
Plot
ModuleCalibrationGood Readback Calibration ok
ReadbackExplanation Colors Red means not calibrated or parameter value outside of bulk distribution
Logfile

Overview

Database comparison
FULLMODULE_ID GRADE BAREMODULE_ID HDI_ID SENSOR_ID BUILTON BUILTBY STATUS tempnominal I150 IVSLOPE PIXELDEFECTS
M3518 B B331153-03-1 737-01-007 S331153-03-1 2015-10-08 10:43:53 INFN INSTOCK m20_1 -1.0 0.0 303
M3518 B B331153-03-1 737-01-007 S331153-03-1 2015-10-08 10:43:53 INFN INSTOCK m20_2 2e-08 1.97 330
M3518 B B331153-03-1 737-01-007 S331153-03-1 2015-10-08 10:43:53 INFN INSTOCK p17_1 7.7e-07 1.16 322
Database comparison - Pixel Defects
Total Dead Bump
C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15 C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15
Reception 328 327 1 87 53 6 13 10 42 4 9 46 34 0 0 16 6 0 1 0 0 1 0 0 0 0 0 0 0 0 0 0 0 0 0
Database 322 316 1 89 58 3 1 10 39 3 11 44 34 0 0 17 6 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
MoReWeb-v1.0.2-10-gbc52a17 on branch master