Test Date: 2016-05-27 11:11
Analysis date: 2016-09-16 11:08
M2102 ModuleReceptionTestNoPretest_p17_1
Chips

Overview

Pixel Alive Map
Summary
Module Module M2102
Grade Grade A
ManualGrade Manual grade -
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
DeadPixels Dead Pixels 4
DefectiveBumps Bump Defects 37
DefectiveBumpsMax Max BumpDef/ROC 32
DeadPixelsMax Max Dead Pixels/ROC 2
Readback Readback calibration bad/unfinished
Bump Bonding Defects Map
Bump Bonding Thrmap
IVCurve
Plot
CurrentAtVoltage150V I(150 V) 0.89 μA
Variation I(150 V) / I(100 V) 1.18
IV150DB I(150 V) Fulltest 0.86 μA
ReadbackStatus
Plot
ModuleCalibrationGood Readback Calibration bad/unfinished
ReadbackExplanation Colors Red means not calibrated or parameter value outside of bulk distribution
Logfile

Overview

Database comparison
FULLMODULE_ID GRADE BAREMODULE_ID HDI_ID SENSOR_ID BUILTON BUILTBY STATUS tempnominal I150 IVSLOPE PIXELDEFECTS
M2102 A B331149-03-2 549-80-006 S331149-03-2 2015-08-26 00:00:00 PSI INSTOCK m20_1 -1.0 0.0 47
M2102 B B331149-03-2 549-80-006 S331149-03-2 2015-08-26 00:00:00 PSI INSTOCK m20_2 6e-08 1.58 42
M2102 A B331149-03-2 549-80-006 S331149-03-2 2015-08-26 00:00:00 PSI INSTOCK p17_1 8.6e-07 1.17 45
Database comparison - Pixel Defects
Total Dead Bump
C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15 C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 C10 C11 C12 C13 C14 C15
Reception 41 4 2 0 0 0 0 0 0 0 0 0 0 0 0 0 0 2 37 32 0 0 0 1 0 0 0 1 0 0 0 0 0 0 3
Database 45 5 2 0 0 0 1 0 0 0 0 0 0 0 0 0 0 2 39 34 0 0 0 0 0 0 0 1 0 0 0 0 0 0 4
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