Test Date: 2016-07-26 19:31
Analysis date: 2016-07-26 19:56
M3077 ModuleReceptionTest_p17_1
Chips
Overview
Summary
Module |
Module |
M3077 |
|
Grade |
Grade |
B |
|
ManualGrade |
Manual grade |
- |
|
ElectricalGrade |
Electrical Grade |
A |
|
IVGrade |
IV Grade |
B |
|
DeadPixels |
Dead Pixels |
9 |
|
DefectiveBumps |
Bump Defects |
38 |
|
DefectiveBumpsMax |
Max BumpDef/ROC |
11 |
|
DeadPixelsMax |
Max Dead Pixels/ROC |
3 |
|
Readback |
Readback calibration |
ok |
|
IanaLoss
IanaLossProblems |
Iana problems |
No |
|
Mean |
mean |
19.20 |
|
Min |
min |
18.50 |
|
Max |
max |
20.10 |
|
NROCsNotProgrammable |
ROCs not programmable |
0 |
|
IVCurve
CurrentAtVoltage150V |
I(150 V) |
1.26 |
μA |
Variation |
I(150 V) / I(100 V) |
2.34 |
|
IV150DB |
I(150 V) Fulltest |
1.30 |
μA |
ReadbackStatus
ModuleCalibrationGood |
Readback Calibration |
ok |
|
ReadbackExplanation |
Colors |
Red means not calibrated or parameter value outside of bulk distribution |
|
Database comparison
FULLMODULE_ID
|
GRADE
|
BAREMODULE_ID
|
HDI_ID
|
SENSOR_ID
|
BUILTON
|
BUILTBY
|
STATUS
|
tempnominal
|
I150
|
IVSLOPE
|
PIXELDEFECTS
|
M3077
|
B
|
B322498-18-3
|
549-65-012
|
S322498-18-3
|
2015-10-30 17:56:01
|
CERN
|
INSTOCK
|
m20_1
|
7.4e-07
|
4.38
|
50
|
M3077
|
A
|
B322498-18-3
|
549-65-012
|
S322498-18-3
|
2015-10-30 17:56:01
|
CERN
|
INSTOCK
|
m20_2
|
7.9e-07
|
4.38
|
50
|
M3077
|
B
|
B322498-18-3
|
549-65-012
|
S322498-18-3
|
2015-10-30 17:56:01
|
CERN
|
INSTOCK
|
p17_1
|
1.3e-06
|
2.48
|
50
|
Database comparison - Pixel Defects
MoReWeb-v1.0.2-10-gbc52a17 on branch master