Test Date: 2016-11-17 12:02
Analysis date: 2016-12-13 12:13
OnShellQuickTest M3230
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3230 2016-11-17 12:02 2016-11-28 22:52 OnShellQuickTest_p17_1 A 2 16 0 0 None None None 0.99 0.31 -1.0 -1 0.45
M3230 ModuleQualification_Temperature
M3230 ModuleQualification_Humidity
M3230 ModuleQualification_SumOfCurrents
M3230 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master