Test Date: 2016-11-09 16:42
Analysis date: 2016-12-13 12:08
OnShellQuickTest M3227
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3227 2016-11-09 16:42 2016-11-28 22:47 OnShellQuickTest_p17_1 A 12 16 0 0 None None None 1.16 0.3 -1.0 -1 0.43
M3227 ModuleQualification_Temperature
M3227 ModuleQualification_Humidity
M3227 ModuleQualification_SumOfCurrents
M3227 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master