Test Date: 2016-11-09 12:11
Analysis date: 2016-12-13 12:03
OnShellQuickTest M3219
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3219 2016-11-09 12:11 2016-11-28 22:44 OnShellQuickTest_p17_1 A 15 16 0 0 None None None 0.6 0.21 -1.0 -1 0.3
M3219 ModuleQualification_Temperature
M3219 ModuleQualification_Humidity
M3219 ModuleQualification_SumOfCurrents
M3219 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master