Test Date: 2016-11-15 14:10
Analysis date: 2016-12-13 12:02
OnShellQuickTest M3218
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3218 2016-11-15 14:10 2016-11-28 22:43 OnShellQuickTest_p17_1 A 67 16 0 0 None None None 1.03 0.32 -1.0 -1 0.46
M3218 ModuleQualification_Temperature
M3218 ModuleQualification_Humidity
M3218 ModuleQualification_SumOfCurrents
M3218 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master