Test Date: 2016-11-15 14:07
Analysis date: 2016-12-13 12:01
OnShellQuickTest M3216
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3216 2016-11-15 14:07 2016-11-28 22:42 OnShellQuickTest_p17_1 A 13 16 0 0 None None None 1.05 0.25 -1.0 -1 0.36
M3216 ModuleQualification_Temperature
M3216 ModuleQualification_Humidity
M3216 ModuleQualification_SumOfCurrents
M3216 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master