Test Date: 2016-11-08 17:10
Analysis date: 2016-12-13 12:00
OnShellQuickTest M3215
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3215 2016-11-08 17:10 2016-11-28 22:42 OnShellQuickTest_p17_1 A 20 16 0 0 None None None 1.74 0.4 -1.0 -1 0.57
M3215 ModuleQualification_Temperature
M3215 ModuleQualification_Humidity
M3215 ModuleQualification_SumOfCurrents
M3215 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master