Test Date: 2016-11-09 17:01
Analysis date: 2016-12-13 11:59
OnShellQuickTest M3214
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3214 2016-11-09 17:01 2016-11-28 22:41 OnShellQuickTest_p17_1 A 9 16 0 0 None None None 6.58 0.6 -1.0 -1 0.86
M3214 ModuleQualification_Temperature
M3214 ModuleQualification_Humidity
M3214 ModuleQualification_SumOfCurrents
M3214 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master