Test Date: 2016-11-08 17:23
Analysis date: 2016-12-13 11:58
OnShellQuickTest M3210
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3210 2016-11-08 17:23 2016-11-28 22:40 OnShellQuickTest_p17_1 A 19 16 0 0 None None None 1.16 0.36 -1.0 -1 0.51
M3210 ModuleQualification_Temperature
M3210 ModuleQualification_Humidity
M3210 ModuleQualification_SumOfCurrents
M3210 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master