Test Date: 2016-11-08 17:29
Analysis date: 2016-12-13 11:57
OnShellQuickTest M3209
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3209 2016-11-08 17:29 2016-11-28 22:39 OnShellQuickTest_p17_1 A 58 16 0 0 None None None 1.16 0.44 -1.0 -1 0.63
M3209 ModuleQualification_Temperature
M3209 ModuleQualification_Humidity
M3209 ModuleQualification_SumOfCurrents
M3209 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master