Test Date: 2016-11-08 17:33
Analysis date: 2016-12-13 11:55
OnShellQuickTest M3207
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3207 2016-11-08 17:33 2016-11-28 22:37 OnShellQuickTest_p17_1 A 14 16 0 0 None None None 1.07 0.42 -1.0 -1 0.6
M3207 ModuleQualification_Temperature
M3207 ModuleQualification_Humidity
M3207 ModuleQualification_SumOfCurrents
M3207 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master