Test Date: 2016-11-08 09:47
Analysis date: 2016-12-13 11:44
OnShellQuickTest M3176
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3176 2016-11-08 09:47 2016-11-28 22:29 OnShellQuickTest_p17_1 A 10 16 0 0 None None None 0.88 0.32 -1.0 -1 0.46
M3176 ModuleQualification_Temperature
M3176 ModuleQualification_Humidity
M3176 ModuleQualification_SumOfCurrents
M3176 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master