Test Date: 2016-11-08 09:44
Analysis date: 2016-12-13 11:44
OnShellQuickTest M3174
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3174 2016-11-08 09:44 2016-11-28 22:29 OnShellQuickTest_p17_1 A 35 16 0 0 None None None 6.11 0.19 -1.0 -1 0.28
M3174 ModuleQualification_Temperature
M3174 ModuleQualification_Humidity
M3174 ModuleQualification_SumOfCurrents
M3174 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master