Test Date: 2016-11-08 17:44
Analysis date: 2016-12-13 11:40
OnShellQuickTest M3166
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M3166 2016-11-08 17:44 2016-11-28 22:26 OnShellQuickTest_p17_1 A 12 16 0 0 None None None 1.0 0.36 -1.0 -1 0.52
M3166 ModuleQualification_Temperature
M3166 ModuleQualification_Humidity
M3166 ModuleQualification_SumOfCurrents
M3166 ModuleOnShellQuickTest_p17_1

Overview

v1.1.2 on branch psi46master