Test Date: 2016-11-11 17:55
Analysis date: 2016-11-11 17:58
OnShellQuickTest M2356
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M2356 2016-11-11 17:55 OnShellQuickTest_p17_1 A 3 16 0 0 None None None 1.91 0.63 -1.0 -1 0.9
M2356 ModuleQualification_Temperature
M2356 ModuleQualification_Humidity
M2356 ModuleQualification_SumOfCurrents
M2356 ModuleOnShellQuickTest_p17_1

Overview

v1.1.1-5-g98789dd on branch master