Test Date: 2016-11-11 16:24
Analysis date: 2016-11-11 16:25
OnShellQuickTest M2276
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M2276 2016-11-11 16:24 OnShellQuickTest_p17_1 C -1 -1 -1 -1 None None None -1.0 -1.0 -1.0 -1 None incomplete test
M2276 ModuleQualification_Temperature
M2276 ModuleQualification_Humidity
M2276 ModuleQualification_SumOfCurrents
M2276 ModuleOnShellQuickTest_p17_1

Overview

v1.1.1-5-g98789dd on branch master