Test Date: 2016-11-11 13:26
Analysis date: 2016-11-11 13:31
OnShellQuickTest M2174
Module ID Test Date Analysis Test Type Grade Pixel Defects ROCs < 1% ROCs > 1% ROCs > 4% Noise Trimming PHCalibration I(150V) I_rec(150V) IV Slope Temperature initial Current Comments
M2174 2016-11-11 13:26 OnShellQuickTest_p17_1 A 156 16 0 0 None None None 8.82 1.5 -1.0 -1 2.14
M2174 ModuleQualification_Temperature
M2174 ModuleQualification_Humidity
M2174 ModuleQualification_SumOfCurrents
M2174 ModuleOnShellQuickTest_p17_1

Overview

v1.1.1-5-g98789dd on branch master