Test Date: 2015-10-29 13:58
Analysis date: 2015-10-30 19:00
M3022 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M3022
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 39 - 16/0/0
DeadPixels Dead Pixels 14
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 21
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 3
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 15
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-10-29
TestTime Test Time 13:58
TestDuration Test Duration 1:15:08
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 388.3 mA
Summary 3
Noise Noise 142.42 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 46.50 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1198.09 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.67
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.60 μA
CurrentVariation I(150 V) / I(100 V) 1.13
IVCurve
CurrentAtVoltage150V I(150 V) 0.60 μA
Variation I(150 V) / I(100 V) 1.13
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:15:08
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.468 A
Analog Current
Duration Duration 1:15:08
MinCurrent min. Current 0.073 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 388.3 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.30
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test 17.00 +/- 0.07 °C
Duration Duration of test 1:15:13
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
3
0
0
0
0
0
0
0
138.42
1746
44
0.031
1030
Chip 1
A
1
0
0
1
0
0
0
0
0
0
0
141.01
1748
48
0.031
1324
Chip 2
A
1
1
0
0
0
0
0
0
0
0
1
134.15
1748
48
0.037
1278
Chip 3
A
2
0
0
0
0
0
0
2
0
0
1
154.49
1748
48
0.031
1540
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
145.06
1748
45
0.028
1071
Chip 5
A
3
0
0
3
0
0
0
0
0
0
0
152.82
1749
47
0.033
1322
Chip 6
A
5
4
0
1
0
0
0
0
0
0
4
146.52
1752
46
0.034
1093
Chip 7
A
6
4
0
2
1
0
0
0
1
0
4
148.53
1750
47
0.033
1196
Chip 8
A
6
3
0
3
0
0
0
0
0
0
3
151.42
1749
47
0.035
1080
Chip 9
A
2
1
0
1
1
0
0
0
2
0
0
131.00
1750
46
0.030
1212
Chip 10
A
1
1
0
0
0
0
0
0
0
0
1
138.66
1748
49
0.033
1452
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
133.98
1749
46
0.037
1161
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
137.49
1748
46
0.030
1011
Chip 13
A
3
0
0
2
0
0
0
1
0
0
0
143.08
1749
46
0.032
1249
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
139.11
1750
44
0.031
1105
Chip 15
A
5
0
0
4
1
0
0
1
1
0
1
143.02
1748
47
0.041
1047
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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