Test Date: 2015-10-29 13:58
Analysis date: 2015-10-30 18:59
M3022 ModuleFulltestPxar_m20_1
Chips

Overview

_
Summary 1
Module Module M3022
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 44 - 16/0/0
DeadPixels Dead Pixels 14
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 9
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 22
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 3
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 15
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-10-29
TestTime Test Time 13:58
TestDuration Test Duration 1:16:10
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 134.29 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.91 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1118.94 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.73
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:16:10
MinCurrent min. Current 0.361 A
MaxCurrent max. Current 0.525 A
Analog Current
Duration Duration 1:16:10
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.389 A
ModuleIa Module Ia 385.1 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.30
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.02 °C
Duration Duration of test 1:16:25
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
0
0
2
0
0
0
0
0
0
0
108.52
1750
44
0.028
948
Chip 1
A
4
0
0
2
0
0
0
2
0
0
0
146.01
1748
48
0.031
1248
Chip 2
A
3
1
0
0
0
0
0
2
0
0
2
146.76
1748
48
0.041
1189
Chip 3
A
3
0
0
1
0
0
0
2
1
0
1
130.56
1748
46
0.032
1468
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
134.36
1748
46
0.028
1028
Chip 5
A
3
0
0
3
0
0
0
0
0
0
0
136.32
1752
45
0.033
1198
Chip 6
A
5
4
0
1
0
0
0
0
0
0
4
142.46
1748
47
0.031
1002
Chip 7
A
5
4
0
1
1
0
0
1
1
0
4
120.74
1744
45
0.032
1092
Chip 8
A
5
3
0
2
0
0
0
0
0
0
3
134.83
1748
48
0.034
1003
Chip 9
A
2
1
0
1
1
0
0
0
2
0
0
134.88
1748
44
0.028
1119
Chip 10
A
1
1
0
0
0
0
0
0
0
0
1
133.47
1745
48
0.033
1384
Chip 11
A
1
0
0
1
0
0
0
0
0
0
0
131.25
1748
46
0.037
1108
Chip 12
A
2
0
0
1
0
0
0
1
0
0
0
138.07
1746
44
0.029
938
Chip 13
A
3
0
0
2
0
0
0
1
0
0
0
142.26
1749
46
0.033
1156
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
132.00
1748
45
0.031
1027
Chip 15
A
4
0
0
4
1
0
0
0
1
0
0
136.13
1748
46
0.041
996
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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