Test Date: 2015-07-30 09:25
Analysis date: 2015-10-28 15:00
M3021 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3021
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 145 - 15/1/0
DeadPixels Dead Pixels 28
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 8
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 9
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 105
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 30
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-07-30
TestTime Test Time 09:25
TestDuration Test Duration 1:01:27
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x30 0xf6
TBM2 TBM2 ok, 0x00 0xf6
PxarVersion pXar v2.2.5+67 g3b1c276
ModuleIa Module Ia 390.7 mA
Summary 3
Noise Noise 137.74 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.84 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 15/1/0
PedestalSpread Pedestal Spread 1168.41 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.73
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.50 μA
CurrentVariation I(150 V) / I(100 V) 1.16
IVCurve
CurrentAtVoltage150V I(150 V) 0.50 μA
Variation I(150 V) / I(100 V) 1.16
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:01:27
MinCurrent min. Current 0.428 A
MaxCurrent max. Current 0.467 A
Analog Current
Duration Duration 1:01:27
MinCurrent min. Current 0.357 A
MaxCurrent max. Current 0.395 A
ModuleIa Module Ia 390.7 mA
Temperature
Temperature Temp. while test 16.73 +/- 0.26 °C
Duration Duration of test 0:05:20
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
4
2
0
0
1
0
0
1
2
0
1
132.82
1755
54
0.033
1278
Chip 1
A
2
0
0
2
0
0
0
0
0
0
0
142.04
1749
55
0.031
1112
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
137.59
1754
54
0.032
906
Chip 3
A
1
0
0
0
0
0
0
1
1
0
0
147.02
1755
58
0.034
1292
Chip 4
B
103
0
0
0
0
0
0
5
99
0
5
151.38
1758
64
0.106
1314
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
129.87
1756
57
0.033
1254
Chip 6
A
3
1
0
2
0
0
0
0
0
0
1
140.81
1756
56
0.036
914
Chip 7
A
4
4
0
0
0
0
0
0
0
0
4
131.20
1755
56
0.029
1113
Chip 8
A
6
6
0
0
0
0
0
0
0
0
6
143.14
1759
56
0.031
1028
Chip 9
A
2
2
0
0
0
0
0
0
0
0
2
134.37
1758
56
0.030
1162
Chip 10
A
1
1
0
0
0
0
0
0
1
0
0
121.80
1755
58
0.029
1199
Chip 11
A
1
0
0
0
0
0
0
1
0
0
0
140.15
1757
59
0.028
1306
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
135.54
1753
54
0.033
1162
Chip 13
A
6
4
0
2
0
0
0
0
1
0
3
132.69
1754
55
0.032
1104
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
144.42
1756
57
0.034
1220
Chip 15
A
9
8
0
0
0
0
0
0
1
0
8
139.03
1757
62
0.041
1332
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xf6
Core0a_basee Core 0a base e 0x30
Core0b_basea Core 0b base a 0xf6
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 6
RocDelay_Ch1 Roc Delay Ch1 6
RocDelay_Ch2 Roc Delay Ch2 6
RocDelay_Ch3 Roc Delay Ch3 6
Phase400 Phase 400 4
Phase160 Phase 160 1
Errors
nCriticals # Criticals 0
nErrors # Errors 35
nWarnings # Warnings 28
channel_0_count Channel 0 15
channel_1_count Channel 1 48
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 26
message_eventid_count Event ID mismatch 9
message_readback_count Readback start marker 28
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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