Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 18:47
M3021 ModuleFulltestPxar_m20_1
Chips

Overview

_
Summary 1
Module Module M3021
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 105 - 15/1/0
DeadPixels Dead Pixels 27
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 5
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 10
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 2
PHGainDefects PH Gain Defects 69
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 27
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:29:58
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 381.9 mA
Summary 3
Noise Noise 125.76 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.38 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 15/1/0
PedestalSpread Pedestal Spread 1069.03 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:29:58
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.533 A
Analog Current
Duration Duration 1:29:58
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.386 A
ModuleIa Module Ia 381.9 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 18.70
Min min 17.70
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
5
2
0
1
1
0
0
2
2
0
2
128.81
1752
45
0.035
1158
Chip 1
A
1
0
0
1
0
0
0
0
0
0
0
106.13
1750
44
0.032
999
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
106.22
1748
42
0.029
822
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
135.01
1750
44
0.033
1182
Chip 4
B
65
0
0
0
0
0
0
1
64
0
1
146.86
1752
52
0.106
1198
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
137.33
1751
48
0.032
1167
Chip 6
A
3
1
0
2
0
0
0
0
0
0
1
108.57
1750
44
0.034
810
Chip 7
A
6
4
0
2
0
0
0
0
0
0
4
122.94
1749
44
0.027
1043
Chip 8
A
6
6
0
0
0
0
0
0
0
0
6
128.83
1750
45
0.028
937
Chip 9
A
2
2
0
0
0
0
0
0
0
0
2
130.98
1748
46
0.030
1094
Chip 10
A
2
0
0
1
1
0
0
2
1
0
0
136.74
1750
48
0.029
1098
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
139.05
1750
46
0.028
1201
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
111.43
1749
43
0.032
1047
Chip 13
A
5
4
0
1
0
0
0
0
2
0
3
101.27
1751
42
0.033
984
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
129.72
1752
46
0.033
1144
Chip 15
A
8
8
0
0
0
0
0
0
0
0
8
142.27
1748
48
0.042
1222
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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