Test Date: 2015-07-30 09:25
Analysis date: 2015-10-28 15:34
M3019 ModuleFulltest_p17_1
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module M3019
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 86 - 16/0/0
DeadPixels Dead Pixels 16
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 18
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 33
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 24
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 24
BumpBondingMap
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-07-30
TestTime Test Time 09:25
TestDuration Test Duration 1:00:18
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x30 0xf6
TBM2 TBM2 ok, 0x00 0xf6
PxarVersion pXar v2.2.5+67 g3b1c276
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 140.31 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.03 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1207.12 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.39 μA
CurrentVariation I(150 V) / I(100 V) 1.11
IVCurve
Plot
CurrentAtVoltage150V I(150 V) 0.39 μA
Variation I(150 V) / I(100 V) 1.11
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:00:18
MinCurrent min. Current 0.431 A
MaxCurrent max. Current 0.469 A
Analog Current
Plot
Duration Duration 1:00:18
MinCurrent min. Current 0.363 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 383.5 mA
Temperature
Plot
Temperature Temp. while test 16.72 +/- 0.22 °C
Duration Duration of test 1:03:23
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
4
1
0
3
0
0
0
0
0
0
1
149.91
 1759
56
0.035
1225
Chip 1
A
6
0
0
5
0
0
0
1
1
0
0
146.84
 1758
58
0.036
1124
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
143.33
 1758
51
0.033
1291
Chip 3
A
4
1
0
0
0
0
0
3
0
0
3
141.03
 1750
55
0.045
1017
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
129.16
 1757
53
0.031
1085
Chip 5
A
1
0
0
1
0
0
0
0
0
0
0
136.51
 1758
56
0.033
1270
Chip 6
A
1
0
0
1
0
0
0
0
0
0
0
136.35
 1760
56
0.035
1300
Chip 7
A
6
2
0
3
0
0
0
1
0
0
2
125.22
 1755
55
0.037
1162
Chip 8
A
3
2
0
1
0
0
0
0
0
0
2
148.40
 1755
56
0.030
1214
Chip 9
A
3
1
0
2
0
0
0
0
0
0
1
137.80
 1758
55
0.032
1034
Chip 10
A
27
0
0
2
0
0
1
6
22
0
4
153.54
 1764
64
0.094
1372
Chip 11
A
8
1
0
3
0
0
0
4
1
0
2
148.32
 1760
59
0.036
1284
Chip 12
A
5
0
0
4
0
0
0
1
0
0
1
144.95
 1756
54
0.037
1410
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
133.37
 1759
57
0.034
1231
Chip 14
A
9
5
0
4
0
0
0
0
0
0
5
132.42
 1757
56
0.031
1198
Chip 15
A
5
3
0
0
0
0
0
2
0
0
3
137.89
 1757
56
0.025
1096
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xf6
Core0a_basee Core 0a base e 0x30
Core0b_basea Core 0b base a 0xf6
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 6
RocDelay_Ch1 Roc Delay Ch1 6
RocDelay_Ch2 Roc Delay Ch2 6
RocDelay_Ch3 Roc Delay Ch3 6
Phase400 Phase 400 4
Phase160 Phase 160 1
Errors
nCriticals # Criticals 0
nErrors # Errors 14
nWarnings # Warnings 39
channel_0_count Channel 0 0
channel_1_count Channel 1 53
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 11
message_eventid_count Event ID mismatch 3
message_readback_count Readback start marker 39
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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