Test Date: 2015-10-26 10:27
Analysis date: 2015-10-26 19:46
M3017 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M3017
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 62 - 16/0/0
DeadPixels Dead Pixels 19
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 15
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 27
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 8
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 22
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-26
TestTime Test Time 10:27
TestDuration Test Duration 1:32:55
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 385.1 mA
Summary 3
Noise Noise 138.89 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 46.41 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1249.22 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:32:55
MinCurrent min. Current 0.364 A
MaxCurrent max. Current 0.474 A
Analog Current
Duration Duration 1:32:55
MinCurrent min. Current 0.075 A
MaxCurrent max. Current 0.39 A
ModuleIa Module Ia 385.1 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 18.80
Min min 18.50
Max max 19.30
Temperature
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
9
4
0
4
0
0
0
1
1
0
4
127.40
1750
48
0.028
1332
Chip 1
A
8
4
0
2
0
0
0
2
2
0
4
139.62
1748
48
0.037
1160
Chip 2
A
3
1
0
2
0
0
0
0
0
0
1
137.65
1749
52
0.032
1693
Chip 3
A
5
0
0
2
0
0
0
3
0
0
1
130.02
1740
46
0.030
1323
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
143.02
1748
44
0.033
1048
Chip 5
A
8
0
0
2
0
0
0
6
0
0
3
143.64
1750
53
0.030
1456
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
142.73
1750
44
0.031
1166
Chip 7
A
2
0
0
1
1
0
0
0
1
0
0
144.12
1748
46
0.034
1096
Chip 8
A
3
1
0
2
0
0
0
0
0
0
1
142.29
1748
46
0.032
1275
Chip 9
A
4
0
0
2
0
0
0
2
2
0
0
144.11
1749
46
0.033
1268
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
143.12
1750
49
0.033
1191
Chip 11
A
4
0
0
4
0
0
0
0
0
0
0
140.62
1750
44
0.036
1086
Chip 12
A
4
2
0
1
0
0
0
1
1
0
2
134.02
1750
44
0.031
1051
Chip 13
A
5
4
0
1
0
0
0
0
0
0
4
137.19
1750
44
0.038
1325
Chip 14
A
3
1
0
2
0
0
0
0
1
0
0
145.20
1749
44
0.035
1264
Chip 15
A
3
2
0
1
0
0
0
0
0
0
2
127.52
1750
46
0.045
1254
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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