Test Date: 2015-06-26 09:57
Analysis date: 2015-10-28 15:43
M3017 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3017
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 64 - 16/0/0
DeadPixels Dead Pixels 19
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 15
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 29
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 24
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-06-26
TestTime Test Time 09:57
TestDuration Test Duration 0:54:44
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar v2.2.4+51 gdb2a247
ModuleIa Module Ia 387.5 mA
Summary 3
Noise Noise 138.68 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.97 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1246.16 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.68
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.57 μA
CurrentVariation I(150 V) / I(100 V) 1.11
IVCurve
CurrentAtVoltage150V I(150 V) 0.57 μA
Variation I(150 V) / I(100 V) 1.11
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 0:54:44
MinCurrent min. Current 0.445 A
MaxCurrent max. Current 0.475 A
Analog Current
Duration Duration 0:54:44
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.391 A
ModuleIa Module Ia 387.5 mA
Temperature
Temperature Temp. while test 16.69 +/- 0.26 °C
Duration Duration of test 0:54:45
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
11
4
0
4
0
0
0
3
1
0
5
126.36
1754
57
0.028
1340
Chip 1
A
8
4
0
2
0
0
0
2
0
0
6
136.02
1753
56
0.029
1156
Chip 2
A
4
1
0
2
0
0
0
1
0
0
1
140.32
1751
60
0.030
1704
Chip 3
A
5
0
0
2
0
0
0
3
0
0
0
124.73
1751
55
0.028
1317
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
143.49
1750
54
0.034
1053
Chip 5
A
6
0
0
2
0
0
0
4
0
0
2
140.98
1756
62
0.027
1460
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
142.51
1754
56
0.029
1150
Chip 7
A
2
0
0
1
0
0
0
0
1
0
0
143.58
1755
56
0.032
1096
Chip 8
A
4
1
0
2
0
0
0
1
0
0
2
140.30
1750
55
0.032
1269
Chip 9
A
3
0
0
3
0
0
0
0
0
0
0
146.78
1748
55
0.033
1248
Chip 10
A
3
0
0
2
0
0
0
1
0
0
1
147.77
1753
59
0.030
1194
Chip 11
A
4
0
0
4
0
0
0
0
0
0
0
138.08
1750
55
0.034
1094
Chip 12
A
3
2
0
1
0
0
0
0
1
0
1
137.12
1751
52
0.032
1047
Chip 13
A
5
4
0
1
0
0
0
0
0
0
4
141.33
1747
53
0.036
1328
Chip 14
A
3
1
0
2
0
0
0
0
1
0
0
142.73
1752
53
0.033
1240
Chip 15
A
3
2
0
1
0
0
0
0
0
0
2
126.83
1753
58
0.043
1244
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 24
nWarnings # Warnings 75
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 16
message_eventid_count Event ID mismatch 8
message_readback_count Readback start marker 75
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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