Test Date: 2015-06-26 09:57
Analysis date: 2015-10-28 15:42
Analysis date: 2015-10-28 15:42
M3017 ModuleFulltest_m20_1
Summary 1
| Module | Module | M3017 | |
| Grade | Grade | B | |
| ElectricalGrade | Electrical Grade | A | |
| IVGrade | IV Grade | B | |
| ManualGrade | Manual Grade | None | |
| PixelDefects | Pixel Defects - A/B/C | 69 - 16/0/0 | |
| DeadPixels | Dead Pixels | 19 | |
| AddressProblems | Address Problems | 0 | |
| ThresholdDefects | Threshold Defects | 18 | |
| MaskDefects | Mask Defects | 0 | |
| DeadBumps | Dead Bumps | 30 | |
| NoisyPixels | Noise Defects | 0 | |
| TrimProblems | Trim Problems | 1 | |
| PHGainDefects | PH Gain Defects | 3 | |
| PHPedestalDefects | PH Pedestal Defects | 0 | |
| PHPar1Defects | PH Parameter1 Defects | 29 |
Summary 2
| TestCenter | Test Center | CERN | |
| TestDate | Test Date | 2015-06-26 | |
| TestTime | Test Time | 09:57 | |
| TestDuration | Test Duration | 0:57:25 | |
| TempC | Temparature | -20 | °C |
| TrimPHCal | Trim / phCal | yes / yes | |
| TermCycl | Term. Cycl. | yes | |
| TBM1 | TBM1 | ok, 0x84 0x49 | |
| TBM2 | TBM2 | ok, 0x00 0x49 | |
| PxarVersion | pXar | v2.2.4+51 gdb2a247 | |
| ModuleIa | Module Ia | 385.9 | mA |
Summary 3
| Noise | Noise | 129.89 | e |
| NoiseROCs | Noise grades | 16/0/0 | |
| VcalThrWidth | Vcal Thr. Width | 54.22 | e |
| VcalThrWidthROCs | Vcal Thr. W. grades | 16/0/0 | |
| RelGainWidth | Rel. Gain Width | 0.03 | % |
| RelGainWidthROCs | Rel. Gain W. grades | 16/0/0 | |
| PedestalSpread | Pedestal Spread | 1163.41 | e |
| PedestalSpreadROCs | Ped. Spread grades | 16/0/0 | |
| Parameter1 | Parameter1 | 0.71 | |
| Parameter1ROCs | Par1 grades | 16/0/0 | |
| CurrentAtVoltage150V | I_rec(150 V) @ 17°C | 1.61 | μA |
| CurrentAtVoltage150V_ORIG | I_orig(150V) @ -20.0 °C | 0.04 | μA |
| CurrentVariation | I(150 V) / I(100 V) | 1.06 |
IVCurve
| CurrentAtVoltage150V | I_orig(150V) @ -20.0 °C | 0.04 | μA |
| Variation | I(150 V) / I(100 V) | 1.06 | |
| recalculatedCurrentAtVoltage150V | I_rec(150 V) @ 17°C | 1.61 | μA |
| recalculatedCurrentVariation | I_rec(150 V) / I_rec(100 V) | 1.06 | |
| CurrentRatio100V | I(+17C)/I(-20C) 100V | 15.30 | |
| CurrentRatio150V | I(+17C)/I(-20C) 150V | 15.97 |
Digital Current
| Duration | Duration | 0:57:25 | |
| MinCurrent | min. Current | 0.447 | A |
| MaxCurrent | max. Current | 0.475 | A |
Analog Current
| Duration | Duration | 0:57:25 | |
| MinCurrent | min. Current | 0.362 | A |
| MaxCurrent | max. Current | 0.389 | A |
| ModuleIa | Module Ia | 385.9 | mA |
Temperature
| Temperature | Temp. while test | -20.00 +/- 0.02 | °C |
| Duration | Duration of test | 0:57:20 |
Summary ROCs
| ROC | Grade | Total | Dead | Mask | Bumps | Trim(Bits) | Address | Noise | Thresh | Gain | Ped | Par1 | Mean noise | Thr [e-] | Thr width | Rel gain width | Ped spread |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Chip 0 |
A
|
8
|
4
|
0
|
4
|
0
|
0
|
0
|
0
|
1
|
0
|
3
|
138.03
|
1752 |
56
|
0.028
|
1298
|
| Chip 1 |
A
|
7
|
4
|
0
|
2
|
0
|
0
|
0
|
1
|
0
|
0
|
5
|
139.89
|
1752 |
56
|
0.032
|
1064
|
| Chip 2 |
A
|
4
|
1
|
0
|
2
|
0
|
0
|
0
|
1
|
0
|
0
|
1
|
134.93
|
1754 |
58
|
0.033
|
1636
|
| Chip 3 |
A
|
5
|
0
|
0
|
2
|
0
|
0
|
0
|
3
|
0
|
0
|
2
|
129.83
|
1752 |
54
|
0.031
|
1232
|
| Chip 4 |
A
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
127.91
|
1754 |
52
|
0.031
|
974
|
| Chip 5 |
A
|
10
|
0
|
0
|
2
|
1
|
0
|
0
|
7
|
0
|
0
|
6
|
138.48
|
1756 |
60
|
0.028
|
1386
|
| Chip 6 |
A
|
2
|
0
|
0
|
0
|
0
|
0
|
0
|
2
|
0
|
0
|
2
|
133.63
|
1752 |
51
|
0.030
|
1078
|
| Chip 7 |
A
|
3
|
0
|
0
|
1
|
0
|
0
|
0
|
1
|
1
|
0
|
0
|
133.76
|
1752 |
54
|
0.032
|
1010
|
| Chip 8 |
A
|
4
|
1
|
0
|
2
|
0
|
0
|
0
|
1
|
0
|
0
|
2
|
124.40
|
1750 |
53
|
0.030
|
1189
|
| Chip 9 |
A
|
3
|
0
|
0
|
3
|
0
|
0
|
0
|
0
|
0
|
0
|
0
|
118.45
|
1753 |
52
|
0.030
|
1130
|
| Chip 10 |
A
|
3
|
0
|
0
|
2
|
0
|
0
|
0
|
1
|
0
|
0
|
0
|
132.29
|
1752 |
54
|
0.031
|
1070
|
| Chip 11 |
A
|
5
|
0
|
0
|
4
|
0
|
0
|
0
|
1
|
0
|
0
|
0
|
131.60
|
1752 |
52
|
0.034
|
1030
|
| Chip 12 |
A
|
4
|
2
|
0
|
2
|
0
|
0
|
0
|
0
|
0
|
0
|
2
|
110.96
|
1754 |
52
|
0.032
|
954
|
| Chip 13 |
A
|
5
|
4
|
0
|
1
|
0
|
0
|
0
|
0
|
0
|
0
|
4
|
116.71
|
1753 |
54
|
0.034
|
1230
|
| Chip 14 |
A
|
3
|
1
|
0
|
2
|
0
|
0
|
0
|
0
|
1
|
0
|
0
|
132.24
|
1751 |
52
|
0.032
|
1126
|
| Chip 15 |
A
|
3
|
2
|
0
|
1
|
0
|
0
|
0
|
0
|
0
|
0
|
2
|
135.08
|
1754 |
57
|
0.043
|
1206
|
TBM
| nTBMs | n | 1 | |
| TBMType | Type | tbm08c | |
| Core0a_basea | Core 0a base a | 0x49 | |
| Core0a_basee | Core 0a base e | 0x84 | |
| Core0b_basea | Core 0b base a | 0x49 | |
| Core0b_basee | Core 0b base e | 0x00 | |
| RocDelay_Ch0 | Roc Delay Ch0 | 1 | |
| RocDelay_Ch1 | Roc Delay Ch1 | 1 | |
| RocDelay_Ch2 | Roc Delay Ch2 | 1 | |
| RocDelay_Ch3 | Roc Delay Ch3 | 1 | |
| Phase400 | Phase 400 | 1 | |
| Phase160 | Phase 160 | 4 |
Errors
| nCriticals | # Criticals | 0 | |
| nErrors | # Errors | 25 | |
| nWarnings | # Warnings | 55 | |
| channel_0_count | Channel 0 | 0 | |
| channel_1_count | Channel 1 | 0 | |
| channel_2_count | Channel 2 | 0 | |
| channel_3_count | Channel 3 | 0 | |
| message_tokenchain_count | Token Chain Length | 14 | |
| message_eventid_count | Event ID mismatch | 11 | |
| message_readback_count | Readback start marker | 55 | |
| message_notokenpass_count | has NoTokenPass | 0 | |
| message_datasize_count | Data size criticals | 0 | |
| message_missingevents_count | Missing Event criticals | 0 | |
| message_usbtimeout_count | USB criticals | 0 | |
| message_deser400_count | DESER400 failure | 0 | |
| message_daqerror_count | DAQ error | 0 |
GradingParameters
| ModifiedGrading | Modified Grading | False |
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