Test Date: 2015-07-27 09:56
Analysis date: 2015-10-28 14:48
M3015 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3015
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 43 - 16/0/0
DeadPixels Dead Pixels 4
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 18
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 20
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 12
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-07-27
TestTime Test Time 09:56
TestDuration Test Duration 1:01:07
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x30 0xf6
TBM2 TBM2 ok, 0x00 0xf6
PxarVersion pXar v2.2.5+67 g3b1c276
ModuleIa Module Ia 379.4 mA
Summary 3
Noise Noise 145.31 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 58.59 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1203.66 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.70
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.33 μA
CurrentVariation I(150 V) / I(100 V) 1.04
IVCurve
CurrentAtVoltage150V I(150 V) 0.33 μA
Variation I(150 V) / I(100 V) 1.04
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:01:07
MinCurrent min. Current 0.431 A
MaxCurrent max. Current 0.469 A
Analog Current
Duration Duration 1:01:07
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.382 A
ModuleIa Module Ia 379.4 mA
Temperature
Temperature Temp. while test 16.73 +/- 0.26 °C
Duration Duration of test 0:05:16
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
4
0
0
2
0
0
0
2
0
0
0
135.64
1755
60
0.031
1292
Chip 1
A
4
0
0
3
0
0
0
1
1
0
0
137.76
1752
57
0.035
1081
Chip 2
A
2
0
0
1
0
0
0
1
0
0
1
142.33
1755
58
0.029
1012
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
147.21
1753
55
0.028
1166
Chip 4
A
5
0
0
1
0
0
0
4
0
0
2
182.83
1759
69
0.049
1288
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
156.14
1756
60
0.032
1326
Chip 6
A
6
1
0
2
0
0
0
3
1
0
1
145.30
1757
57
0.030
1105
Chip 7
A
1
0
0
1
0
0
0
0
0
0
0
145.90
1753
55
0.037
1128
Chip 8
A
2
0
0
2
0
0
0
0
0
0
0
147.51
1758
62
0.035
1532
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
148.13
1758
60
0.038
1084
Chip 10
A
5
0
0
1
0
0
0
3
1
0
2
146.40
1754
57
0.047
1404
Chip 11
A
3
1
0
1
0
0
0
1
0
0
2
148.36
1757
64
0.037
1152
Chip 12
A
2
0
0
0
0
0
0
2
0
0
2
130.82
1742
58
0.033
1346
Chip 13
A
1
0
0
1
0
0
0
0
0
0
0
131.81
1740
52
0.027
968
Chip 14
A
3
0
0
3
0
0
0
0
0
0
0
133.31
1754
55
0.034
1253
Chip 15
A
4
2
0
2
1
0
0
0
1
0
2
145.52
1758
57
0.035
1124
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xf6
Core0a_basee Core 0a base e 0x30
Core0b_basea Core 0b base a 0xf6
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 6
RocDelay_Ch1 Roc Delay Ch1 6
RocDelay_Ch2 Roc Delay Ch2 6
RocDelay_Ch3 Roc Delay Ch3 6
Phase400 Phase 400 4
Phase160 Phase 160 1
Errors
nCriticals # Criticals 0
nErrors # Errors 12
nWarnings # Warnings 12
channel_0_count Channel 0 0
channel_1_count Channel 1 24
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 10
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 12
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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