Test Date: 2015-07-27 09:56
Analysis date: 2015-10-28 14:47
M3015 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M3015
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 42 - 16/0/0
DeadPixels Dead Pixels 4
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 18
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 19
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 12
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-07-27
TestTime Test Time 09:56
TestDuration Test Duration 1:01:52
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x30 0xf6
TBM2 TBM2 ok, 0x00 0xf6
PxarVersion pXar v2.2.5+67 g3b1c276
ModuleIa Module Ia 394.7 mA
Summary 3
Noise Noise 136.93 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.34 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1118.59 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.75
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.33 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.01 μA
CurrentVariation I(150 V) / I(100 V) 1.17
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.01 μA
Variation I(150 V) / I(100 V) 1.17
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.33 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.17
CurrentRatio100V I(+17C)/I(-20C) 100V 50.63
CurrentRatio150V I(+17C)/I(-20C) 150V 45.33
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:01:52
MinCurrent min. Current 0.432 A
MaxCurrent max. Current 0.472 A
Analog Current
Duration Duration 1:01:52
MinCurrent min. Current 0.359 A
MaxCurrent max. Current 0.398 A
ModuleIa Module Ia 394.7 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 0:05:22
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
2
0
0
0
1
0
0
1
128.66
1760
57
0.031
1219
Chip 1
A
4
0
0
3
0
0
0
1
0
0
0
134.32
1757
56
0.031
990
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
134.35
1754
55
0.031
954
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
130.22
1752
55
0.029
1074
Chip 4
A
4
0
0
1
0
0
1
2
0
0
0
168.51
1755
64
0.048
1164
Chip 5
A
1
0
0
0
0
0
0
1
1
0
0
148.44
1755
60
0.037
1263
Chip 6
A
5
1
0
2
0
0
0
2
1
0
2
140.43
1752
58
0.029
1004
Chip 7
A
1
0
0
1
0
0
0
0
0
0
0
128.19
1750
49
0.036
1025
Chip 8
A
1
0
0
1
0
0
0
0
0
0
0
143.00
1755
60
0.037
1459
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
135.43
1754
56
0.037
1020
Chip 10
A
2
0
0
0
0
0
0
2
1
0
2
136.84
1752
56
0.050
1300
Chip 11
A
6
1
0
2
0
0
0
3
0
0
3
142.70
1754
60
0.037
1076
Chip 12
A
1
0
0
0
0
0
0
1
0
0
1
124.95
1753
56
0.033
1238
Chip 13
A
1
0
0
1
0
0
0
0
0
0
0
124.12
1752
51
0.028
899
Chip 14
A
4
0
0
3
0
0
0
1
0
0
0
135.33
1754
55
0.034
1153
Chip 15
A
6
2
0
2
1
0
0
2
1
0
3
135.45
1756
55
0.035
1057
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xf6
Core0a_basee Core 0a base e 0x30
Core0b_basea Core 0b base a 0xf6
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 6
RocDelay_Ch1 Roc Delay Ch1 6
RocDelay_Ch2 Roc Delay Ch2 6
RocDelay_Ch3 Roc Delay Ch3 6
Phase400 Phase 400 4
Phase160 Phase 160 1
Errors
nCriticals # Criticals 1
nErrors # Errors 35
nWarnings # Warnings 233
channel_0_count Channel 0 226
channel_1_count Channel 1 42
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 11
message_eventid_count Event ID mismatch 24
message_readback_count Readback start marker 233
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 1
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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