Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 18:14
M3015 ModuleFulltestPxar_p17_1
Chips

Overview

_
Summary 1
Module Module M3015
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 39 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 12
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 20
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 2
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 13
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:33:24
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 383.5 mA
Summary 3
Noise Noise 142.16 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 47.09 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1198.84 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.69
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.00 μA
CurrentVariation I(150 V) / I(100 V) 0.00
IVCurve
CurrentAtVoltage150V I(150 V) 0.00 μA
Variation I(150 V) / I(100 V) 0.00
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:33:24
MinCurrent min. Current 0.358 A
MaxCurrent max. Current 0.469 A
Analog Current
Duration Duration 1:33:24
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.388 A
ModuleIa Module Ia 383.5 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.40
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test 17.00 +/- 0.05 °C
Duration Duration of test 1:33:26
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
2
0
0
0
0
0
0
1
134.20
1750
46
0.030
1283
Chip 1
A
3
0
0
3
0
0
0
0
0
0
0
135.56
1750
44
0.031
1078
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
139.27
1750
46
0.028
1013
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
142.52
1748
44
0.027
1164
Chip 4
A
4
0
0
1
0
0
0
2
0
0
2
184.02
1750
57
0.049
1306
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
152.48
1752
49
0.033
1316
Chip 6
A
3
1
0
2
0
0
0
0
0
0
1
142.13
1750
46
0.024
1094
Chip 7
A
1
0
0
1
0
0
0
0
0
0
0
142.77
1749
43
0.037
1109
Chip 8
A
5
0
0
2
0
0
0
3
1
0
2
144.63
1750
50
0.037
1518
Chip 9
A
3
0
0
0
0
0
0
3
0
0
2
145.77
1752
49
0.038
1076
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
134.25
1752
48
0.047
1380
Chip 11
A
4
1
0
1
0
0
0
2
0
0
1
143.15
1750
49
0.037
1148
Chip 12
A
1
0
0
0
0
0
0
1
0
0
1
129.19
1748
46
0.032
1350
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
132.26
1747
44
0.027
965
Chip 14
A
3
0
0
3
0
0
0
0
0
0
0
132.80
1747
44
0.033
1252
Chip 15
A
5
3
0
1
0
0
0
1
1
0
3
139.53
1748
46
0.037
1129
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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