Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 18:13
M3015 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M3015
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 34 - 16/0/0
DeadPixels Dead Pixels 5
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 7
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 19
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 9
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:35:32
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x08 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 390.7 mA
Summary 3
Noise Noise 134.55 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 46.78 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1109.28 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 0.00
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 0.00
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
CurrentRatio100V I(+17C)/I(-20C) 100V 71.36
CurrentRatio150V I(+17C)/I(-20C) 150V -1.00
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:35:32
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.521 A
Analog Current
Duration Duration 1:35:32
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.395 A
ModuleIa Module Ia 390.7 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.30
Min min 18.50
Max max 20.10
Temperature
Temperature Temp. while test -20.00 +/- 0.04 °C
Duration Duration of test 1:57:19
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
0
0
2
0
0
0
0
0
0
0
131.05
1749
46
0.031
1190
Chip 1
A
3
0
0
3
0
0
0
0
0
0
0
133.10
1749
46
0.031
980
Chip 2
A
2
0
0
1
0
0
0
1
1
0
1
130.38
1750
46
0.032
954
Chip 3
A
1
0
0
1
0
0
0
0
0
0
0
122.25
1750
43
0.029
1067
Chip 4
A
2
0
0
1
0
0
0
1
0
0
0
161.50
1752
52
0.046
1169
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
145.20
1748
54
0.035
1243
Chip 6
A
3
1
0
2
0
0
0
0
0
0
1
140.96
1751
48
0.026
1001
Chip 7
A
1
0
0
1
0
0
0
0
0
0
0
119.39
1748
42
0.035
1012
Chip 8
A
4
0
0
2
0
0
0
1
1
0
1
140.09
1748
48
0.036
1447
Chip 9
A
1
0
0
0
0
0
0
1
0
0
1
137.73
1750
47
0.035
1010
Chip 10
A
2
0
0
0
0
0
0
0
2
0
0
131.46
1750
47
0.051
1292
Chip 11
A
3
1
0
1
0
0
0
1
0
0
1
141.03
1749
46
0.037
1056
Chip 12
A
1
0
0
0
0
0
0
1
0
0
1
129.33
1750
46
0.034
1226
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
121.30
1748
44
0.030
887
Chip 14
A
3
0
0
2
0
0
0
1
0
0
1
134.30
1750
46
0.037
1152
Chip 15
A
4
3
0
1
0
0
0
0
1
0
2
133.72
1748
44
0.036
1062
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0x08
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 2
Phase160 Phase 160 0
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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