Test Date: 2015-07-07 08:07
Chip 4
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 17/17
Efficiency Efficiency 50/120 99.87/99.29
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C4
InterpolatedEfficiency50 Interpol. Efficiency 50 99.87
InterpolatedEfficiency120 Interpol. Efficiency 120 99.29
Efficiency Distr. 150: C4
N N 4160
mu μ 97.97
sigma σ 3.07
Efficiency Distr. 250: C4
N N 4160
mu μ 94.93
sigma σ 5.86
Efficiency Distr. 100: C4
N N 4160
mu μ 99.26
sigma σ 1.44
Efficiency Distr. 50: C4
N N 4160
mu μ 99.84
sigma σ 0.60
Efficiency Distr. 200: C4
N N 4160
mu μ 95.27
sigma σ 5.61
Background Map 150: C4
RealHitrate Real Hitrate 159.87 MHz/cm2
Background Map 250: C4
RealHitrate Real Hitrate 219.94 MHz/cm2
Background Map 100: C4
RealHitrate Real Hitrate 111.43 MHz/cm2
Background Map 50: C4
RealHitrate Real Hitrate 56.30 MHz/cm2
Background Map 200: C4
RealHitrate Real Hitrate 214.09 MHz/cm2
Hit Map 50: C4
RealHitrate Real Hitrate 55.66 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 17
Bump Bonding Defects 50: C4
Hit Map 150: C4
RealHitrate Real Hitrate 158.47 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 17
Bump Bonding Defects 150: C4
Col. Read. Unif. 50: C4
N N 7842507
mu μ 157966
sigma σ 397.45
Col. Read. Unif. 150: C4
N N 22394444
mu μ 452352
sigma σ 672.57
Read. Unif. over Time 50: C4
N N 9000212
mu μ 9128
sigma_th σ_th 95.54
Time unif. distribution 50: C4
chi2/ndf chi2/ndf 0.94
sigma σ 98.95
sigma_th σ_th 95.55
Read. Unif. over Time 150: C4
N N 25621589
mu μ 25985
sigma_th σ_th 161.20
Time unif. distribution 150: C4
chi2/ndf chi2/ndf 8.86
sigma σ 183.07
sigma_th σ_th 161.23
Col. Uniformity Ratio: C4
Col. Uniformity per Event: C4 50
Col. Uniformity per Event: C4 150
S-Curve widths: Noise (e^{-}) C4 100
N N 4045
mu μ 368.20
sigma σ 106.64
threshold thr 3532.75
fit_peak fit peak 319
fit_skewness ​ɣ​1 7.01e-01
under <= 36.00
over >= 79.00