Test Date: 2015-07-07 08:07
Chip 2
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 10/10
Efficiency Efficiency 50/120 99.84/99.04
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C2
InterpolatedEfficiency50 Interpol. Efficiency 50 99.84
InterpolatedEfficiency120 Interpol. Efficiency 120 99.04
Efficiency Distr. 150: C2
N N 4160
mu μ 99.11
sigma σ 2.33
Efficiency Distr. 250: C2
N N 4160
mu μ 97.87
sigma σ 4.63
Efficiency Distr. 100: C2
N N 4160
mu μ 99.66
sigma σ 1.01
Efficiency Distr. 50: C2
N N 4160
mu μ 99.92
sigma σ 0.40
Efficiency Distr. 200: C2
N N 4160
mu μ 97.92
sigma σ 4.66
Background Map 150: C2
RealHitrate Real Hitrate 85.56 MHz/cm2
Background Map 250: C2
RealHitrate Real Hitrate 121.14 MHz/cm2
Background Map 100: C2
RealHitrate Real Hitrate 58.71 MHz/cm2
Background Map 50: C2
RealHitrate Real Hitrate 28.64 MHz/cm2
Background Map 200: C2
RealHitrate Real Hitrate 116.06 MHz/cm2
Hit Map 50: C2
RealHitrate Real Hitrate 28.18 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 10
Bump Bonding Defects 50: C2
Hit Map 150: C2
RealHitrate Real Hitrate 84.26 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 10
Bump Bonding Defects 150: C2
Col. Read. Unif. 50: C2
N N 3786779
mu μ 61611
sigma σ 248.22
Col. Read. Unif. 150: C2
N N 11427905
mu μ 193037
sigma σ 439.36
Read. Unif. over Time 50: C2
N N 4557458
mu μ 4622
sigma_th σ_th 67.99
Time unif. distribution 50: C2
chi2/ndf chi2/ndf 1.00
sigma σ 67.04
sigma_th σ_th 67.99
Read. Unif. over Time 150: C2
N N 13622180
mu μ 13816
sigma_th σ_th 117.54
Time unif. distribution 150: C2
chi2/ndf chi2/ndf 1.86
sigma σ 125.66
sigma_th σ_th 117.56
Col. Uniformity Ratio: C2
Col. Uniformity per Event: C2 50
Col. Uniformity per Event: C2 150
S-Curve widths: Noise (e^{-}) C2 100
N N 4158
mu μ 279.85
sigma σ 68.87
threshold thr 3034.58
fit_peak fit peak 248
fit_skewness ​ɣ​1 7.17e-01
over >= 2.00