Test Date: 2015-07-07 08:07
Chip 15
Grading
ROCGrade Final ROC Grade B
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 51/51
Efficiency Efficiency 50/120 99.87/99.33
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (B)/B
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C15
InterpolatedEfficiency50 Interpol. Efficiency 50 99.87
InterpolatedEfficiency120 Interpol. Efficiency 120 99.33
Efficiency Distr. 150: C15
N N 4160
mu μ 99.63
sigma σ 0.87
Efficiency Distr. 250: C15
N N 4160
mu μ 99.10
sigma σ 1.46
Efficiency Distr. 100: C15
N N 4160
mu μ 99.84
sigma σ 0.59
Efficiency Distr. 50: C15
N N 4160
mu μ 99.94
sigma σ 0.35
Efficiency Distr. 200: C15
N N 4160
mu μ 99.19
sigma σ 1.37
Background Map 150: C15
RealHitrate Real Hitrate 89.13 MHz/cm2
Background Map 250: C15
RealHitrate Real Hitrate 123.81 MHz/cm2
Background Map 100: C15
RealHitrate Real Hitrate 61.37 MHz/cm2
Background Map 50: C15
RealHitrate Real Hitrate 30.36 MHz/cm2
Background Map 200: C15
RealHitrate Real Hitrate 120.48 MHz/cm2
Hit Map 50: C15
RealHitrate Real Hitrate 30.56 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 51
Bump Bonding Defects 50: C15
Hit Map 150: C15
RealHitrate Real Hitrate 89.49 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 51
Bump Bonding Defects 150: C15
Col. Read. Unif. 50: C15
N N 4389302
mu μ 104799
sigma σ 323.73
Col. Read. Unif. 150: C15
N N 12871937
mu μ 308527
sigma σ 555.45
Read. Unif. over Time 50: C15
N N 4942001
mu μ 5012
sigma_th σ_th 70.80
Time unif. distribution 50: C15
chi2/ndf chi2/ndf 1.06
sigma σ 71.59
sigma_th σ_th 70.80
Read. Unif. over Time 150: C15
N N 14468592
mu μ 14674
sigma_th σ_th 121.14
Time unif. distribution 150: C15
chi2/ndf chi2/ndf 2.57
sigma σ 126.77
sigma_th σ_th 121.16
Col. Uniformity Ratio: C15
Col. Uniformity per Event: C15 50
Col. Uniformity per Event: C15 150
S-Curve widths: Noise (e^{-}) C15 100
N N 4153
mu μ 285.91
sigma σ 73.41
threshold thr 3002.69
fit_peak fit peak 257
fit_skewness ​ɣ​1 6.86e-01
under <= 5.00
over >= 2.00