Test Date: 2015-07-07 08:07
Chip 11
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
37/37 |
|
Efficiency |
Efficiency 50/120 |
99.89/99.35 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C11
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.89 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.35 |
|
Efficiency Distr. 150: C11
N |
N |
4160 |
|
mu |
μ |
97.47 |
|
sigma |
σ |
3.67 |
|
Efficiency Distr. 250: C11
N |
N |
4160 |
|
mu |
μ |
93.54 |
|
sigma |
σ |
7.19 |
|
Efficiency Distr. 100: C11
N |
N |
4160 |
|
mu |
μ |
99.08 |
|
sigma |
σ |
1.73 |
|
Efficiency Distr. 50: C11
N |
N |
4160 |
|
mu |
μ |
99.82 |
|
sigma |
σ |
0.63 |
|
Efficiency Distr. 200: C11
N |
N |
4160 |
|
mu |
μ |
94.03 |
|
sigma |
σ |
6.99 |
|
Background Map 150: C11
RealHitrate |
Real Hitrate |
173.41 |
MHz/cm2 |
Background Map 250: C11
RealHitrate |
Real Hitrate |
238.30 |
MHz/cm2 |
Background Map 100: C11
RealHitrate |
Real Hitrate |
120.50 |
MHz/cm2 |
Background Map 50: C11
RealHitrate |
Real Hitrate |
61.02 |
MHz/cm2 |
Background Map 200: C11
RealHitrate |
Real Hitrate |
233.18 |
MHz/cm2 |
Hit Map 50: C11
RealHitrate |
Real Hitrate |
60.51 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
37 |
|
Bump Bonding Defects 50: C11
Hit Map 150: C11
RealHitrate |
Real Hitrate |
172.46 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
37 |
|
Bump Bonding Defects 150: C11
Col. Read. Unif. 50: C11
N |
N |
8578196 |
|
mu |
μ |
256620 |
|
sigma |
σ |
506.58 |
|
Col. Read. Unif. 150: C11
N |
N |
24500580 |
|
mu |
μ |
714941 |
|
sigma |
σ |
845.54 |
|
Read. Unif. over Time 50: C11
N |
N |
9785080 |
|
mu |
μ |
9924 |
|
sigma_th |
σ_th |
99.62 |
|
Time unif. distribution 50: C11
chi2/ndf |
chi2/ndf |
1.27 |
|
sigma |
σ |
105.18 |
|
sigma_th |
σ_th |
99.63 |
|
Read. Unif. over Time 150: C11
N |
N |
27882317 |
|
mu |
μ |
28278 |
|
sigma_th |
σ_th |
168.16 |
|
Time unif. distribution 150: C11
chi2/ndf |
chi2/ndf |
12.18 |
|
sigma |
σ |
193.00 |
|
sigma_th |
σ_th |
168.19 |
|
Col. Uniformity Ratio: C11
Col. Uniformity per Event: C11 50
Col. Uniformity per Event: C11 150
S-Curve widths: Noise (e^{-}) C11 100
N |
N |
4107 |
|
mu |
μ |
365.29 |
|
sigma |
σ |
97.03 |
|
threshold |
thr |
3478.22 |
|
fit_peak |
fit peak |
332 |
|
fit_skewness |
ɣ1 |
5.88e-01 |
|
under |
<= |
25.00 |
|
over |
>= |
28.00 |
|