Test Date: 2015-07-07 08:07
Chip 1
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 28/28
Efficiency Efficiency 50/120 99.86/99.23
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C1
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.23
Efficiency Distr. 150: C1
N N 4160
mu μ 99.53
sigma σ 1.00
Efficiency Distr. 250: C1
N N 4160
mu μ 98.88
sigma σ 1.64
Efficiency Distr. 100: C1
N N 4160
mu μ 99.78
sigma σ 0.68
Efficiency Distr. 50: C1
N N 4160
mu μ 99.94
sigma σ 0.35
Efficiency Distr. 200: C1
N N 4160
mu μ 98.97
sigma σ 1.54
Background Map 150: C1
RealHitrate Real Hitrate 92.24 MHz/cm2
Background Map 250: C1
RealHitrate Real Hitrate 129.46 MHz/cm2
Background Map 100: C1
RealHitrate Real Hitrate 63.63 MHz/cm2
Background Map 50: C1
RealHitrate Real Hitrate 31.63 MHz/cm2
Background Map 200: C1
RealHitrate Real Hitrate 124.77 MHz/cm2
Hit Map 50: C1
RealHitrate Real Hitrate 31.24 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 28
Bump Bonding Defects 50: C1
Hit Map 150: C1
RealHitrate Real Hitrate 92.16 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 28
Bump Bonding Defects 150: C1
Col. Read. Unif. 50: C1
N N 4526319
mu μ 98624
sigma σ 314.04
Col. Read. Unif. 150: C1
N N 13353266
mu μ 283921
sigma σ 532.84
Read. Unif. over Time 50: C1
N N 5051880
mu μ 5124
sigma_th σ_th 71.58
Time unif. distribution 50: C1
chi2/ndf chi2/ndf 1.09
sigma σ 73.16
sigma_th σ_th 71.58
Read. Unif. over Time 150: C1
N N 14900221
mu μ 15112
sigma_th σ_th 122.93
Time unif. distribution 150: C1
chi2/ndf chi2/ndf 4.50
sigma σ 137.00
sigma_th σ_th 122.95
Col. Uniformity Ratio: C1
Col. Uniformity per Event: C1 50
Col. Uniformity per Event: C1 150
S-Curve widths: Noise (e^{-}) C1 100
N N 4151
mu μ 305.80
sigma σ 77.27
threshold thr 3150.14
fit_peak fit peak 270
fit_skewness ​ɣ​1 6.95e-01
under <= 7.00
over >= 2.00