Test Date: 2015-07-06 19:07
M2026 ModuleFulltestPxar_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M2026
Grade Grade A
PixelDefects Pixel Defects - A/B/C 220 - 0/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 1
ThresholdDefects Threshold Defects 16
MaskDefects Mask Defects 1
DeadBumps Dead Bumps 15
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 16
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-07-06
TestTime Test Time 19:07
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 140.61 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 59.88 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1172.12 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 1.00
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:03:06
MinCurrent min. Current 0.449 A
MaxCurrent max. Current 0.478 A
Digital Current
Plot
Duration Duration 1:03:06
MinCurrent min. Current 0.355 A
MaxCurrent max. Current 0.388 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 2 0 1 1 1 1 0 2 0 0 0
Chip 1 24 0 0 0 24 0 0 2 0 0 0
Chip 2 2 0 0 0 2 0 0 0 0 0 0
Chip 3 45 0 0 0 45 0 0 0 0 0 0
Chip 4 4 0 0 0 4 0 0 0 0 0 0
Chip 5 11 0 0 0 11 0 0 0 0 0 0
Chip 6 14 0 0 2 12 0 0 0 0 0 0
Chip 7 10 0 0 3 7 0 0 1 0 0 0
Chip 8 21 0 0 1 20 0 0 0 0 0 0
Chip 9 5 0 0 1 4 0 0 0 0 0 0
Chip 10 14 0 0 1 13 0 0 0 0 0 0
Chip 11 11 0 0 1 10 0 0 0 0 0 0
Chip 12 16 0 0 0 16 0 0 9 0 0 0
Chip 13 26 0 0 0 26 0 0 0 0 0 0
Chip 14 12 0 0 3 9 0 0 2 0 0 0
Chip 15 3 0 0 2 1 0 0 0 0 0 0
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