Test Date: 2015-05-20 15:05
M2023 ModuleFulltest_p17_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M2023
Grade Grade C
PixelDefects Pixel Defects - A/B/C 474 - 0/0/0
DeadPixels Dead Pixels 6
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 14
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 312
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 14
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-05-20
TestTime Test Time 15:05
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 132.25 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 58.28 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1242.78 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 1.00
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:32:03
MinCurrent min. Current 0.449 A
MaxCurrent max. Current 0.478 A
Digital Current
Plot
Duration Duration 1:32:03
MinCurrent min. Current 0.385 A
MaxCurrent max. Current 0.388 A
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 42 0 0 35 8 0 0 0 0 0 0
Chip 1 19 0 0 17 2 0 0 4 0 0 0
Chip 2 26 0 0 22 4 0 0 1 0 0 0
Chip 3 51 0 0 40 11 0 0 0 0 0 0
Chip 4 39 0 0 30 9 0 0 1 0 0 0
Chip 5 62 1 0 58 3 0 0 1 0 0 0
Chip 6 39 0 0 37 2 0 0 0 0 0 0
Chip 7 17 2 0 5 10 0 0 3 0 0 0
Chip 8 63 0 0 50 13 0 0 0 0 0 0
Chip 9 23 1 0 1 21 0 0 1 0 0 0
Chip 10 45 0 0 11 34 0 0 0 0 0 0
Chip 11 16 0 0 1 15 0 0 0 0 0 0
Chip 12 7 1 0 2 4 0 0 1 0 0 0
Chip 13 18 0 0 3 15 0 0 0 0 0 0
Chip 14 5 1 0 0 4 0 0 2 0 0 0
Chip 15 2 0 0 0 2 0 0 0 0 0 0
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