Test Date: 2015-07-07 10:07
M2023 ModuleFulltestPxar_m20_1
Chips

Overview

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Vcal Threshold
Summary 1
Module Module M2023
Grade Grade C
PixelDefects Pixel Defects - A/B/C 431 - 0/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 9
ThresholdDefects Threshold Defects 13
MaskDefects Mask Defects 9
DeadBumps Dead Bumps 315
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 13
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2015-07-07
TestTime Test Time 10:07
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 116.20 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 57.16 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1139.16 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 1.05
Parameter1ROCs Par1 grades 16/0/0
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Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:15:11
MinCurrent min. Current 0.452 A
MaxCurrent max. Current 0.478 A
Digital Current
Plot
Duration Duration 1:15:11
MinCurrent min. Current 0.348 A
MaxCurrent max. Current 0.384 A
Temperature
Plot
Temperature Temp. while test -20.00 +/- 0.02 °C
Duration Duration of test 1:15:09
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 41 0 0 35 6 0 0 0 0 0 0
Chip 1 17 0 0 16 1 0 0 1 0 0 0
Chip 2 30 0 0 27 3 0 0 0 0 0 0
Chip 3 45 0 0 40 5 0 0 0 0 0 0
Chip 4 43 0 0 31 13 0 0 0 0 0 0
Chip 5 60 0 1 59 1 1 0 1 0 0 0
Chip 6 41 0 0 37 4 0 0 0 0 0 0
Chip 7 5 0 2 1 4 2 0 3 0 0 0
Chip 8 56 0 0 47 11 0 0 0 0 0 0
Chip 9 23 0 1 1 22 1 0 1 0 0 0
Chip 10 35 0 0 13 24 0 0 1 0 0 0
Chip 11 3 0 2 0 3 2 0 2 0 0 0
Chip 12 10 0 1 4 6 1 0 1 0 0 0
Chip 13 17 0 0 4 13 0 0 0 0 0 0
Chip 14 3 0 2 0 3 2 0 3 0 0 0
Chip 15 2 0 0 0 2 0 0 0 0 0 0
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