Test Date: 2015-06-05 18:06
Chip 8
X-ray Calibration - Target Zn Method Spectrum Chip C8
Center |
Center of Peak |
55.45 ± 0.09 |
Vcal |
TargetEnergy |
Energy of target Zn |
8638.91 |
eV |
TargetNElectrons |
Energy of target Zn |
2399.7 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
68.49 |
|
Rate |
Rate |
340.60 |
kHz/cm² |
X-ray Calibration - Target Mo Method Spectrum Chip C8
Center |
Center of Peak |
107.68 ± 0.06 |
Vcal |
TargetEnergy |
Energy of target Mo |
17479.37 |
eV |
TargetNElectrons |
Energy of target Mo |
4855.38 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
42.43 |
|
Rate |
Rate |
479.90 |
kHz/cm² |
X-ray Calibration - Target Ag Method Spectrum Chip C8
Center |
Center of Peak |
135.79 ± 0.09 |
Vcal |
TargetEnergy |
Energy of target Ag |
22162.92 |
eV |
TargetNElectrons |
Energy of target Ag |
6156.37 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
19.26 |
|
Rate |
Rate |
251.10 |
kHz/cm² |
X-ray Calibration - Target Sn Method Spectrum Chip C8
Center |
Center of Peak |
154.77 ± 0.11 |
Vcal |
TargetEnergy |
Energy of target Sn |
25271.36 |
eV |
TargetNElectrons |
Energy of target Sn |
7019.82 |
nElectrons |
Chi2PerNDF |
Chi^2 per NDF |
14.37 |
|
Rate |
Rate |
159.60 |
kHz/cm² |
X-ray Calibration - Vcal Calibration Method Spectrum Chip C8
Slope |
Slope |
46.049 ± 0.112 |
nElectrons/VCal |
Offset |
Offset |
-102.195 ± 13.913 |
nElectrons |
X-ray Hit Map - Target Zn Method Spectrum Chip C8
Rate |
Rate |
340.60 |
kHz/cm² |
NTrigs |
N Trig |
5913115 |
Trigger |
NHits |
N Hits |
31417 |
Hits |
X-ray Hit Map - Target Mo Method Spectrum Chip C8
Rate |
Rate |
479.90 |
kHz/cm² |
NTrigs |
N Trig |
5913243 |
Trigger |
NHits |
N Hits |
44267 |
Hits |
X-ray Hit Map - Target Ag Method Spectrum Chip C8
Rate |
Rate |
251.10 |
kHz/cm² |
NTrigs |
N Trig |
5913128 |
Trigger |
NHits |
N Hits |
23166 |
Hits |
X-ray Hit Map - Target Sn Method Spectrum Chip C8
Rate |
Rate |
159.60 |
kHz/cm² |
NTrigs |
N Trig |
5912980 |
Trigger |
NHits |
N Hits |
14721 |
Hits |